Stable chargino
cut_Etmiss
cut_ptmin
cut_pmin
cut_pmin
cut_pt
cut_DR_1
cut_scthits
cut_p1_eta
cut_p2_eta
cut_p3_eta
massScaleFacto
r
100
80
150
1.00E+06
1
0.25
6
-0.11
0.17
-0.044
Direi che siamo compatibili con la selezione 1 candidato
Tight di Troels &co a 500 GeV, see next.
La grossa differenza la fa il trigger,
immagino che potremmo ampliarla anche noi volendo.
0.92
200 GeV
500 GeV
800 GeV
Rel.Eff
Abs.Eff
Rel.Eff
Abs.Eff
Rel.Eff
Abs.Eff
trigger
0.11
0.110
0.18
0.181
0.21
0.206
MET
0.57
0.062
0.80
0.145
0.89
0.182
skim
0.55
0.034
0.68
0.098
0.71
0.130
isolation
0.92
0.032
0.92
0.090
0.91
0.118
pCut
0.90
0.029
0.98
0.088
0.98
0.114
ionization
0.37
0.011
0.77
0.067
0.91
0.103
Metastable
• Same cuts as stable and as Rhadrons analysis
• A partire dalle squeezed, troviamo 1.6 e 2.9%
per 150 e 300 GeV , 1 ns lifetime
150 GeV, 1ns
generated
squeezed
GRL
cleaning
trigger
MET
PV
skim
isolation
electronVeto
pCut
ionization
50000
9387
9387
9370
9085
8281
8267
5945
4967
4953
4581
785
300 GeV, 1 ns
0.19
1.00
1.00
0.97
0.91
1.00
0.72
0.84
1.00
0.92
0.17
0.188
0.188
0.187
0.182
0.166
0.165
0.119
0.099
0.099
0.092
0.016
20000
3284
3284
3281
3213
3048
3041
2164
1602
1597
1452
589
0.16
1.00
1.00
0.98
0.95
1.00
0.71
0.74
1.00
0.91
0.41
0.164
0.164
0.164
0.161
0.152
0.152
0.108
0.080
0.080
0.073
0.029
Metastable da non filtered
• Solo 150 GeV, 1 ns, ma siccome l’efficienza
viene uguale a prima (dovrebbe essere
cambiato solo il cleaning) , possiamo
assumere eff 3% sul 300 GeV.
150 GeV, 1 ns
Rel.Eff
Abs.Eff
trigger
0.71
0.713
MET
0.87
0.623
skim
0.19
0.119
isolation
0.84
0.099
pCut
0.92
0.092
ionization
0.18
0.017
Confronto con Susy kinked (Shimpei)
150 GeV, 1 ns
Signal: 150 GeV, 1 ns
Event selection: 5.5% vs 62.3%
Track selection: 15.4% vs 2.7%
Overall:
0.85% vs 1.7%
Rel.Eff
Abs.Eff
trigger
0.71
0.713
MET
0.87
0.623
skim
0.19
0.119
isolation
0.84
0.099
pCut
0.92
0.092
ionization
0.18
0.017
Kinked selection is more efficient at the track level,
but it is penalized by the event cuts.
(btw, allora andrebbe alla grande con FTK che toglie il
bias di evento)