CARLOSv3 0.25mm Rad-Hard & ALICE SDD DAQ Chain Test Samuele Antinori - Davide Falchieri Alessandro Gabrielli Enzo Gandolfi – Massimo Masetti INFN Bologna 2003 - Davide Falchieri 1 9+4 A P ½ SDD ½ SDD P A 9+4 JTAG CARLOS v3 5 16 tx_en cav, dav TLK-1501 GOL DES 200 m 16 rxdata L0 rx-ck busy CTP QPLL ck (40 MHz) serial back-link 4 JTAG A P ½ SDD ½ SDD P A 9+4 JTAG 9+4 5 16 tx_en cav, dav CARLOS v3 TLK-1501 GOL DES 200 m CARLOS rx 16 rxdata 32 5 rx-ck JTAG DDL 7 QPLL ck (40 MHz) serial back-link JTAG 4 pRORC TTCrx INFN Bologna 2003 - Davide Falchieri 2 State of the Art (June 2002 – June 2003) The main topics we have been facing are the following: Design, realization and test of 2 digital ASICs: CARLOSv3 and LVDS-CMOS converter rad-hard in 0.25mm CMOS technology by CERN EP-MIC (Marchioro) Test of CARLOSv3 and LVDS-CMOS on a dedicated test board with Tektronix instruments Test of CARLOSv3 with optical link (TX + RX from Lab. Elettronica INFN BO) Design of a DAQ chain from CARLOSv3 to the CERN DDL: interface board CARLOSv3_rx (VIRTEXII FPGA) Test of the DAQ chain both in Bologna and at CERN Even thanks to the portable DAQ chain we have been able to run the data acquisition through DDL at CERN: FOR THE SECOND YEAR THIS WAS THE FIRST ALICE DDL CHAIN TESTED AT CERN INFN Bologna 2003 - Davide Falchieri 3 CARLOSv3 pictures 2D Compressor for Core 40 MHz SRAMs (2-Read 1-Write) 100 Pads Final Layout 4x4 mm2 Full-Custom RAMs for the 2D-Compressor 40MHz Clock CARLOSv3 chip yield 33 out of 35 packaged chips INFN Bologna 2003 - Davide Falchieri 4 2D Compressor HW Implementation Programmable up to 256 Time-Samples Up to 256 x 9-bit dual port Rad-Hard SRAM Up to 256 x 9-bit dual port Rad-Hard SRAM HALF-DETECTOR matrix from AMBRA Potential Clusters 5 data at a time are evaluated by taking into account the 2 thresholds of the 2D algorithm If the requirements are met the central cluster position and its amplitude are packed and transmitted After each event data set received from AMBRA, CARLOS disables AMBRA for 256 clock period for emptying the successive FIFOs Off border data are forced to zero! INFN Bologna 2003 - Davide Falchieri 5 CARLOSv3 with LVDS-CMOS Test Board (Sketch) INPUT STRIP CONNECTOR Right Hybrid Left Hybrid LVDS CMOS TEST STRIP CONNECTOR oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo CARLOSv3 OUTPUT STRIP CONNECTOR oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo DDL CARLOSv3_rx The board interfaces 2 AMBRAs Torino Bologna INFN Bologna 2003 - Davide Falchieri CERN/EP-AID 6 CARLOSv3 with LVDS-CMOS Test Board (Photo) INPUT STRIP CONNECTOR LVDS CMOS TEST STRIP CONNECTOR CARLOSv3 OUTPUT STRIP CONNECTOR CARLOSv3 fully tested on: JTAG, Serial Back-Link Data-Compression Pattern Generator State Analyzer Test Patterns made of: ten 50k-word events Sockets 50 packaged chips CQFP100 Lvds-Cmos chip yield 15/15 ---- CARLOSv3 chip yield 33/35 INFN Bologna 2003 - Davide Falchieri 7 Test of CARLOSv3 Optical-Link CARLOSv2_rx (Sketch) Pattern Generator CARLOSv3 CARD SERIALIZER CARD DESERIALIZER CARD OPTICAL LINK 2002 CARLOSv2_rx State Analyzer GOL TLK 1501 CARLOSv2_rx SIMU JTAG signals and Back-Link Bologna Bologna INFN LAB CERN/EP-MIC INFN Bologna 2003 - Davide Falchieri CERN/EP-AID 8 Test of CARLOSv3 Optical-Link CARLOSv2_rx (Photo) Pattern Generator SERIALIZER CARD OPTICAL LINK DESERIALIZER CARD 2002 CARLOSv2_rx SIMU CARLOSv3 CARD State Analyzer GOL INFN Bologna 2003 - Davide Falchieri 9 CARLOSv3_rx Test Board (Sketch) STRIP CONNECTOR CARLOS v3 CARLOS v3 oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo CARLOSv3_rx PROM CONNECTOR for DDL oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo oo Final solution, still to be fully redesigned, will receive data from about 22 CARLOS chips SIU SIMU Bologna INFN Bologna 2003 - Davide Falchieri DIU pRORC CERN/EP-AID 10 AMBRA CARLOSv3 CARLOSv3_rx DDL for TEST-BEAM (Sketch) CARLOSv3 BOARDS CARLOSv3_rx Pattern Generator At CERN Serial Back-Link and JTAG signals must be provided through DDL AMBRA AMBRA DIU pRORC SIU AMBRA AMBRA 4-bit JTAG Serial Back-Link SIMU State Analyzer Serial Back-Link 4-bit JTAG Torino Bologna Bologna INFN Bologna 2003 - Davide Falchieri CERN/EP-AID 11 Test of the chain with the DDL at CERN (06/06/03) CARLOSv3 test-bench (50-kword event) SIU (DDL) Up to 3M events transferred Optical Fiber to Linux PC (DDL) CARLOSv3_rx For the second year this was the first ALICE DDL chain tested at CERN: to be presented next week at DAQ meeting INFN Bologna 2003 - Davide Falchieri 12 Test of the LAST YEAR chain with the DDL at CERN (14/06/02) CERN INTERNAL REPORT ALICE-INT-2002-24 This year we are planning to write another internal note for the new DAQ test INFN Bologna 2003 - Davide Falchieri 13 Bologna work plan 2003 CARLOSv4: further test chip before production: estimated area always 4x4 mm2 Further tests at CERN for tuning the DAQ chain: CARLOSv3-CARLOSv3_rx-DDL Test-Beam on August 2003 with front-end electronics (SDD Detector, Pascal, Ambra) Design of the final versions of CARLOS chip, CARLOS_rx board INFN Bologna 2003 - Davide Falchieri 14